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TAP4000 - Tektronix Probe
- Model: TAP4000
- Manufactured by: Tektronix
Tektronix TAP4000 4GHz Active Probe, TekVPI Interface
Features:
TAP4000: ≥4 GHz Probe Bandwidth
≥0.8 pF Input Capacitance
40 kilohms Input Resistance
-4 V to +4 V Input Dynamic Range
-10 V to +10 V DC Input Offset Range
Small Compact Probe Head for Probing Small Geometry Circuit Elements
DUT Attachment Accessories Enable Connection to SMDs As Small As 0.5 mm Pitch
Robust Design for Reliability
Description:
TAP4000 Single-ended Active FET Probe provides excellent high-speed electrical and mechanical performance required for today's digital system designs. Specifically designed for use and direct connection to oscilloscopes with the TekVPI probe interface, the TAP4000 Active FET probe achieves high-speed signal acquisition and measurement fidelity by solving three traditional problems:
Versatile mechanical performance
Small compact probe head for probing small geometry circuit elements
DUT attachment accessories enable connection to SMDs as small as 0.5 mm pitch
Robust design for reliability
Easy to use
Connects directly to oscilloscopes with the TekVPI probe interface
Provides automatic units scaling and readout on the oscilloscope display
Easy access to oscilloscope probe menu display for probe status/diagnostic information and to control probe DC offset
Remote GPIB/USB probe control through the oscilloscope
Applications:
Verification, debug, and characterization of high-speed designs
Signal integrity, jitter, and timing analysis
Manufacturing engineering and test
Signals with voltage swings up to 8 Vp-p
Features:
TAP4000: ≥4 GHz Probe Bandwidth
≥0.8 pF Input Capacitance
40 kilohms Input Resistance
-4 V to +4 V Input Dynamic Range
-10 V to +10 V DC Input Offset Range
Small Compact Probe Head for Probing Small Geometry Circuit Elements
DUT Attachment Accessories Enable Connection to SMDs As Small As 0.5 mm Pitch
Robust Design for Reliability
Description:
TAP4000 Single-ended Active FET Probe provides excellent high-speed electrical and mechanical performance required for today's digital system designs. Specifically designed for use and direct connection to oscilloscopes with the TekVPI probe interface, the TAP4000 Active FET probe achieves high-speed signal acquisition and measurement fidelity by solving three traditional problems:
Versatile mechanical performance
Small compact probe head for probing small geometry circuit elements
DUT attachment accessories enable connection to SMDs as small as 0.5 mm pitch
Robust design for reliability
Easy to use
Connects directly to oscilloscopes with the TekVPI probe interface
Provides automatic units scaling and readout on the oscilloscope display
Easy access to oscilloscope probe menu display for probe status/diagnostic information and to control probe DC offset
Remote GPIB/USB probe control through the oscilloscope
Applications:
Verification, debug, and characterization of high-speed designs
Signal integrity, jitter, and timing analysis
Manufacturing engineering and test
Signals with voltage swings up to 8 Vp-p
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